What is Yield Control Software?

While controlling in-line production data by SPC systems is a long established
standard in semiconductor manufacturing, the use of electrical test data for
controlling the health of a manufacturing line is a more recent trend.

Although the use of these data for controlling a manufacturing line has been
demanded frequently, the large amount of data generated by the test equipment
has set practical limits for the deployment of such systems in the past.

YieldWatchDog is the solution to the challenges caused by the
enormous amount of wafer test data for process monitoring using patent-
pending new statistical strategies.

Most yield excursions are preceded by early warnings that are seldom
detected and reacted on time.

YieldWatchDog identifies early signs of yield degradation and automatically
notifies the responsible personnel, allowing them to react early and hence avoid
production losses.