YieldWatchDog 2.8.
PRODUCT FEATURES

  • Available as FAB Control, SOLAR Edition or TEST FLOOR Control

  • Monitoring of electrical wafer test data using novel statistical aggregation

  • Automatic notification in case of suspicious trends of any tested parameter

  • Additional monitoring of classical defect density and other derived
    parameters

  • Enhanced sensitivity for small process shifts using EWMA filtering

  • Thin client for fast review of monitored data

  • Easy to use – intuitive look and feel, no need for intensive training

  • Novel algorithms for optimized sensitivity, even if lots are not tested in the
    same order as they were manufactured

  • „One-click“ adjustment to minimize rate of false positive alerts

  • Automatic cleaning and maintenance of data storage

  • Implemented on Microsoft .NET 2.0 framework for long-lasting platform
    support

  • Works together with existing YMS solutions or as a stand-alone software

For a complete product description, please contact our sales team or your local
representative!

Available Optional Modules:
Equipment Monitoring Module
Spatial Signature Control Module
Advanced Quality Gate Module
YieldWatchDog