YieldWatchDog 2.8.
PRODUCT FEATURES

• Available as FAB Control, SOLAR Edition or TEST FLOOR Control
  

• Monitoring of electrical wafer test data using novel statistical aggregation
  

• Automatic notification in case of suspicious trends of any tested parameter
  

• Additional monitoring of classical defect density and other derived
  parameters
  

• Enhanced sensitivity for small process shifts using EWMA filtering
  

• Thin client for fast review of monitored data
  

• Easy to use – intuitive look and feel, no need for intensive training
  

• Novel algorithms for optimized sensitivity, even if lots are not tested in the
  same order as they were manufactured
  

• „One-click“ adjustment to minimize rate of false positive alerts
  

• Automatic cleaning and maintenance of data storage
  

• Implemented on Microsoft .NET 2.0 framework for long-lasting platform
  support
  

• Works together with existing YMS solutions or as a stand-alone software
  

For a complete product description, please contact our sales team or your local
representative!

Available Optional Modules:
Equipment Monitoring Module
Spatial Signature Control Module
Advanced Quality Gate Module