DR YIELD will be presenting at the following semiconductor exhibitions and
conferences. If you want to be informed about updates and additions to this list,
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find 2007 events here.
Date/Location
 Event
 What
Mar 5, 2008
Brussels, Belgium
 SEMI Europe Standards
Spring Event 2008
 Invited talk "How can the
PV industry benefit from
process control and yield
management techniques
in Microelectronics?"
Mar 31-Apr 2, 2008
Tel Aviv, Israel
 AEC-APC Europe (Advanced
Equipment Control/Advanced
Process Control) Conference
 Exhibit
May 5-7, 2008
Cambridge, MA
 ASMC 2008 (Advanced
Semiconductor Manufacturing
Conference)
 Paper "Early Detection of
a Manufacturing Problem
Using Product Test Data"
Nov 20-21, 2008
Fuveau, France
 11th Technical & Scientific
Meeting of ARCSIS
 Presentation "Using
product test data for
wafer manufacturing
process control"