Date/Location	Event	What
March 1-4, 2007 Hong Kong	Global Semiconductor Forum	Product Presentation
March 18-20, 2007 Shanghai, China	ISTC (International Semiconductor Technology Conference)	Paper "Using novel monitor- and correlation- techniques for advanced semiconductor manufacturing"
April 18-20, 2007 Dresden, Germany	AEC-APC Europe (Advanced Equipment Control/Advanced Process Control) Conference	Paper "Early Detection of Spatial Failure Patterns on Wafers"
June 11-12, 2007 Stresa, Italy	ASMC 2007 (Advanced Semiconductor Manufacturing Conference)	Paper "Multivariate Statistical Control of Product Test Data and Yield"
October 22-25, 2007 Austin, TX	4th ISMI Symposium on Manufacturing Effectiveness	Exhibit
December 5-7, 2007 Chiba, Japan	SEMICON Japan	Co-Exhibit with our Japanese Partner Marubeni Information Systems