


| Date/Location |
Event |
What |
| Mar 5, 2008 Brussels, Belgium |
SEMI Europe Standards Spring Event 2008 |
Invited talk "How can the PV industry benefit from process control and yield management techniques in Microelectronics?" |
| Mar 31-Apr 2, 2008 Tel Aviv, Israel |
AEC-APC Europe (Advanced Equipment Control/Advanced Process Control) Conference |
Exhibit |
| May 5-7, 2008 Cambridge, MA |
ASMC 2008 (Advanced Semiconductor Manufacturing Conference) |
Paper "Early Detection of a Manufacturing Problem Using Product Test Data" |
| Dec 3-5 2008 Chiba, Japan |
SEMICON Japan |
Co-Exhibit with our Japanese Partner Marubeni Information Systems |