DR YIELD will be presenting at the following semiconductor exhibitions and
conferences. If you want to be informed about updates and additions to this list,
please subscribe to our e-mail newsletter.
Date/Location
 Event
 What
Mar 5, 2008
Brussels, Belgium
 SEMI Europe Standards
Spring Event 2008
 Invited talk "How can the
PV industry benefit from
process control and yield
management techniques
in Microelectronics?"
Mar 31-Apr 2, 2008
Tel Aviv, Israel
 AEC-APC Europe (Advanced
Equipment Control/Advanced
Process Control) Conference
 Exhibit
May 5-7, 2008
Cambridge, MA
 ASMC 2008 (Advanced
Semiconductor Manufacturing
Conference)
 Paper "Early Detection of
a Manufacturing Problem
Using Product Test Data"
Dec 3-5 2008
Chiba, Japan
 SEMICON Japan
 Co-Exhibit with our
Japanese Partner
Marubeni Information
Systems
find 2007 events here.