YieldWatchDog 3.2 features many improvements particularly
in the AQM, CSS and EMM modules:
- New rules for flagging quality-compromised chips.
- Interactive search for matching wafer patterns, also for
parametric maps.
- Equipment impact matrix report
to mention a few of them.
These are of course in addition to the existing features of the
previous YieldWatchDog releases:
- Configurable data loader for usage in semiconductor,
photovoltaic or other industries
- Ultra-fast performance by using full parallel computing
- Monitoring of all available data using novel statistical
aggregation methods
- Automatic notifications in case of suspicious trends of any
tested parameter
- Additional monitoring of calculated or transformed
parameters
- Enhanced sensitivity for small process shifts using EWMA
filtering
- Thin client for fast review of monitored data
- Easy to use – intuitive look and feel, no need for intensive
training
- Novel algorithms for optimized sensitivity
- „One-click“ adjustment to minimize rate of false positive
alerts
- Automatic cleaning and maintenance of data storage
For a complete product description, please contact our sales
team or your local representative!
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